JC F2 Dot Matrix Module Testing 2nd Gen For iPhone X~12 Series

Name: JC F2 Dot Matrix Module Testing 2nd Gen For iPhone X~12 Series
Brand: JCID
SKU: SPT8010
Availability: InStock

JC F2 Dot Matrix Module Testing 2nd Gen For iPhone X~12 Series

Em promoção Esgotado Pre-order

R 2,059.00

Envio calculado na finalização da compra.

Ships in 1-3 Days

Estimated delivery:

Shipping Included Overseas 6-13 bus days 6-Month Warranty 7-Day Returns

Descrição

1. A professional Face ID dot projector repair device.
2. Support dot projector data testing, reading and burning.
3. Support X-12 series luminous module read & write.
4. Solve the problem that the cable is damaged and I2C is disconnected and unable to read the data.
5. Repair the dot matrix face inaccurate positioning problem.

Ver detalhes completos

Payment Options

html.no-js body { display: block; } html.no-js body > *:not(.no-js-message) { display: none !important; } .no-js-message { text-align: center; } .no-js-message p { font-size: 20px; } Attention!Enable JavaScript in your browser to view this page.

Item adicionado ao seu carrinho

Main menu (Categories)

JC F2 Dot Matrix Module Testing 2nd Gen For iPhone X~12 Series